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Volumn 19, Issue 3, 2002, Pages 259-271

Simulation and comparison of reliability growth models

Author keywords

Computer simulation; Modelling; Reliability

Indexed keywords


EID: 78650757676     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656710210415677     Document Type: Article
Times cited : (2)

References (14)
  • 2
    • 0001782167 scopus 로고
    • Reliability analysis for complex, repairable systems
    • in Proschan, F. and Serfling, R.J. (Eds), SIAM, Philadelphia, PA
    • Crow, L.H. (1974), "Reliability analysis for complex, repairable systems", in Proschan, F. and Serfling, R.J. (Eds), Reliability and Biometry: Statistical Analysis of Lifetimes, SIAM, Philadelphia, PA, pp. 379-410.
    • (1974) Reliability and Biometry: Statistical Analysis of Lifetimes , pp. 379-410
    • Crow, L.H.1
  • 5
    • 0033907639 scopus 로고    scopus 로고
    • A new reliability growth model: Its mathematical comparison to the Duane model
    • Donovan, J. and Murphy, E. (2000), "A new reliability growth model: its mathematical comparison to the Duane model", Microelectron. Reliab., Vol. 40 No. 3, pp. 533-9.
    • (2000) Microelectron. Reliab. , vol.40 , Issue.3 , pp. 533-539
    • Donovan, J.1    Murphy, E.2
  • 6
    • 84937650085 scopus 로고
    • Learning curve approach to reliability monitoring
    • AS-2
    • Duane, J.T. (1964), "Learning curve approach to reliability monitoring", IEEE Trans. Aerospace, AS-2, pp. 553-66.
    • (1964) IEEE Trans. Aerospace , pp. 553-566
    • Duane, J.T.1
  • 9
    • 0016628755 scopus 로고
    • Reliability growth of electronic equipment
    • Mead, P.H. (1975), "Reliability growth of electronic equipment", Microelectron. Reliab., Vol. 14, pp. 439-43.
    • (1975) Microelectron. Reliab. , vol.14 , pp. 439-443
    • Mead, P.H.1
  • 13
    • 0003517458 scopus 로고
    • Report available from Data and Analysis Center for Software, Rome Air Development Center, Rome, New York, NY
    • Musa, J.D. (1979), Software Reliability Data, Report available from Data and Analysis Center for Software, Rome Air Development Center, Rome, New York, NY.
    • (1979) Software Reliability Data
    • Musa, J.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.