A new reliability growth model: Its mathematical comparison to the Duane model

Microelectronics Reliability

Volumn 40, Issue 3, 2000, Pages 533-539

  Donovan, John ^a   Murphy, Eamonn ^b  

^a Atlantic Technological University   (Ireland)

^b UNIVERSITY OF LIMERICK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; RELIABILITY;

DUANE RELIABILITY GROWTH MODEL;

ELECTRONIC EQUIPMENT TESTING;

EID: 0033907639     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2714(99)00235-8     Document Type: Review

References (9)

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3. Donovan J, Murphy E. Reliability growth - a new graphical model. Quality and Reliability Engineering International 1999;15(3):167-74.
4. Mead PH. Reliability growth of electronic equipment. Microelectron Reliab 1975;14:439-43.
5. Mondro MJ. Practical guidelines for conducting a Reliability Growth Program. In: Proceedings of the Institute of Environmental Sciences. 1993. p. 110-6.
6. Hamilton LC. In: Regression with graphics: a second course in applied statistics. Pacific Grove: Brooks/Cole, 1992. p. 181.
7. Montgomery DC, Runger GC. In: Applied statistics and probability for engineers. New York: Wiley, 1994. p. 471-522.
8. Clarke JM, Cougan WP. RPM - a recent real life case history. In: Proceedings of the Annual Reliability and Maintainability Symposium. 1978. p. 279-85.
9. Ebeling CE. In: An introduction to reliability and maintainability engineering. New York: McGraw-Hill, 1997. p. 345-7.