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Volumn 97, Issue 25, 2010, Pages

Extraction of contact resistance in carbon nanofiber via interconnects with varying lengths

Author keywords

[No Author keywords available]

Indexed keywords

BULK RESISTIVITY; COMPATIBLE PROCESS; DEVICE FABRICATIONS; IN-SITU; ONE-DIMENSIONAL NANOSTRUCTURE; SCANNING ELECTRON MICROSCOPE; TEST STRUCTURE; UNDERLAYERS;

EID: 78650752660     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3527927     Document Type: Article
Times cited : (17)

References (15)
  • 1
    • 17944383013 scopus 로고    scopus 로고
    • High-field electrical transport in single-wall carbon nanotubes
    • DOI 10.1103/PhysRevLett.84.2941, 2941
    • Z. Yao, C. L. Kane, and C. Dekker, Phys. Rev. Lett. PRLTAO 0031-9007 84, 2941 (2000). 10.1103/PhysRevLett.84.2941 (Pubitemid 40598935)
    • (2000) Physical Review Letters , vol.84 , Issue.13 , pp. 2941-2944
    • Yao, Z.1    Kane, C.L.2    Dekker, C.3
  • 6
    • 30344487600 scopus 로고    scopus 로고
    • Nonlinear transport and heat dissipation in metallic carbon nanotubes
    • DOI 10.1103/PhysRevLett.95.266803, 266803
    • M. A. Kuroda, A. Cangellaris, and J. -P. Leburton, Phys. Rev. Lett. PRLTAO 0031-9007 95, 266803 (2005). 10.1103/PhysRevLett.95.266803 (Pubitemid 43061570)
    • (2005) Physical Review Letters , vol.95 , Issue.26 , pp. 1-4
    • Kuroda, M.A.1    Cangellaris, A.2    Leburton, J.-P.3
  • 7
    • 34248575328 scopus 로고    scopus 로고
    • Electrical and thermal transport in metallic single-wall carbon nanotubes on insulating substrates
    • DOI 10.1063/1.2717855
    • E. Pop, D. Mann, K. Goodson, and H. Dai, J. Appl. Phys. JAPIAU 0021-8979 101, 093710 (2007). 10.1063/1.2717855 (Pubitemid 46753073)
    • (2007) Journal of Applied Physics , vol.101 , Issue.9 , pp. 093710
    • Pop, E.1    Mann, D.A.2    Goodson, K.E.3    Dai, H.4
  • 11
    • 50949114110 scopus 로고    scopus 로고
    • Proceedings of the IEEE 2008 International Interconnect Technical Conference.
    • J. C. Coiffic, M. Fayolle, H. Le Poche, S. Maitrejean, and S. Olivier, Proceedings of the IEEE 2008 International Interconnect Technical Conference, 2008, p. 153.
    • (2008) , pp. 153
    • Coiffic, J.C.1    Fayolle, M.2    Le Poche, H.3    Maitrejean, S.4    Olivier, S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.