Studying the impact of clones on software defects

Proceedings - Working Conference on Reverse Engineering, WCRE

Volumn , Issue , 2010, Pages 13-21

  Selim, Gehan M K ^a   Barbour, Liliane ^a   Shang, Weiyi ^a   Adams, Bram ^a   Hassan, Ahmed E ^a   Zou, Ying ^a  

^a QUEEN S UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CLONE DETECTION; LONG-LIVED SYSTEMS; SOFTWARE DEFECTS; SOFTWARE SYSTEMS; SURVIVAL ANALYSIS; SURVIVAL MODEL;

BIOINFORMATICS; CLONING; REVERSE ENGINEERING;

DEFECTS;

EID: 78650646355     PISSN: 10951350     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCRE.2010.11     Document Type: Conference Paper

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