Reconstructing solid state nanopore shape from electrical measurements

Applied Physics Letters

Volumn 97, Issue 22, 2010, Pages

  Liebes, Yael ^a   Drozdov, Maria ^b   Avital, Yotam Y ^a   Kauffmann, Yaron ^b   Rapaport, Hanna ^a   Kaplan, Wayne D ^b   Ashkenasy, Nurit ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CHARACTERIZATION; ELECTRICAL MEASUREMENT; ELECTRON MICROSCOPY ANALYSIS; HIGH PRECISION; SOLID-STATE NANOPORE; THREE-DIMENSIONAL SHAPE;

BIOSENSORS; IONIC STRENGTH; THREE DIMENSIONAL;

NANOPORES;

EID: 78650631594     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3521411     Document Type: Article

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