A comprehensive multi-factor analysis on RFID localization capability

Advanced Engineering Informatics

Volumn 25, Issue 1, 2011, Pages 32-40

  Zhou, Junyi ^a   Shi, Jing ^a  

^a North Dakota State University   (United States)

Author keywords

Accuracy; Cramer Rao lower bound (CRLB); Landmark layout; Localization; Radio frequency identification (RFID)

Indexed keywords

ACCURACY; COMPREHENSIVE ANALYSIS; CRAMER-RAO LOWER BOUND; ERROR DISTRIBUTIONS; INDIVIDUAL FACTORS; LANDMARK LAYOUT; LOCALIZATION; LOCALIZATION ACCURACY; LOCATION INFORMATION; MEAN SQUARED ERROR; MONTE CARLO SIMULATION; MULTI-FACTOR; MULTIPLE FACTORS; PERFORMANCE METRICS; RECTANGULAR GEOMETRY; SUPPLY CHAIN APPLICATIONS;

ASPECT RATIO; COMPUTER SIMULATION; CRAMER-RAO BOUNDS; MONTE CARLO METHODS; OPTIMIZATION; RADIO WAVES; SUPPLY CHAINS;

RADIO FREQUENCY IDENTIFICATION (RFID);

EID: 78650608977     PISSN: 14740346     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.aei.2010.05.006     Document Type: Article

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