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Volumn 5, Issue , 2010, Pages 609-612

Fabrication and characterization of a SiC/SiO2/Si piezoresistive pressure sensor

Author keywords

Amorphous films; Piezoresistive properties; Pressure sensors; Silicon carbide

Indexed keywords

ALUMINA; AMORPHOUS FILMS; AMORPHOUS SILICON; DIAPHRAGMS; PRESSURE SENSORS; REACTIVE ION ETCHING; SILICONES;

EID: 78650598348     PISSN: None     EISSN: 18777058     Source Type: Conference Proceeding    
DOI: 10.1016/j.proeng.2010.09.183     Document Type: Conference Paper
Times cited : (28)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.