|
Volumn 5, Issue , 2010, Pages 609-612
|
Fabrication and characterization of a SiC/SiO2/Si piezoresistive pressure sensor
|
Author keywords
Amorphous films; Piezoresistive properties; Pressure sensors; Silicon carbide
|
Indexed keywords
ALUMINA;
AMORPHOUS FILMS;
AMORPHOUS SILICON;
DIAPHRAGMS;
PRESSURE SENSORS;
REACTIVE ION ETCHING;
SILICONES;
ALUMINA SUBSTRATES;
FABRICATION AND CHARACTERIZATIONS;
LITHOGRAPHIC MASK;
MICROMACHINED SILICON;
PIEZORESISTIVE PRESSURE SENSORS;
PIEZORESISTIVE PROPERTIES;
THERMALLY OXIDIZED;
WHEATSTONE BRIDGES;
SILICON CARBIDE;
|
EID: 78650598348
PISSN: None
EISSN: 18777058
Source Type: Conference Proceeding
DOI: 10.1016/j.proeng.2010.09.183 Document Type: Conference Paper |
Times cited : (28)
|
References (5)
|