Temperature dependence of the resonance frequency of thermogravimetric devices

Procedia Engineering

Volumn 5, Issue , 2010, Pages 948-951

  Iervolino, E ^a,c   Riccio, M ^b   Van Herwaarden, A W ^a   Irace, A ^b   Breglio, G ^b   Van Der Vlist, W ^c   Sarro, P M ^c  

^a Xensor Integration   (Netherlands)

^b UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Microcantilever; Resonance frequency; Temperature; Thermogravimetric device

Indexed keywords

NATURAL FREQUENCIES; TEMPERATURE; TEMPERATURE DISTRIBUTION;

HEATING UP; MICRO-CANTILEVERS; RESONANCE FREQUENCIES; TEMPERATURE CALIBRATION; TEMPERATURE DEPENDENCE; TEMPERATURE INDEPENDENTS; TEMPERATURE RANGE; THERMO-GRAVIMETRIC;

RESONANCE;

EID: 78650595510     PISSN: None     EISSN: 18777058     Source Type: Conference Proceeding    
DOI: 10.1016/j.proeng.2010.09.265     Document Type: Conference Paper

References (5)

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2. J. Lee and W. P. ing,"Microthermogravimetry using a microcantilever hot plate with integrated temperature-compensated piezoresistive strain sensors", Review of scientific instruments 79, (2008), pp. 054901-1, 054901-6
3. J.Lee, F.Goericke, W. P. King, "Temperature-dependent thermomechanical noise spectra of doped silicon microcantilevers", Sensors and Actuators A 145-146 (2008),pp. 37-43
4. J.B. Wachtman, Jr., W.E. Tefft, D.G. Lam, Jr., C.S. Apstein, "Exponential Temperature Dependence of Young's Modulus for Several Oxides", Physical review, 12 (6), (1961), pp. 1754-1759
5. E. Iervolino, A.W. van Herwaarden, P.M. Sarro," Temperature calibration of fast scan calorimeter chips" Proc. EUROSENSORS, (2008), pp. 773-776