Experimental evidence of cut-wire-induced enhanced transmission of transverse-electric fields through sub-wavelength slits in a thin metallic screen

Optics Express

Volumn 18, Issue 26, 2010, Pages 26769-26774

  Di Gennaro, Emiliano ^a   Gallina, Ilaria ^b   Andreone, Antonello ^a   Castaldi, Giuseppe ^b   Galdi, Vincenzo ^b  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b UNIVERSITY OF SANNIO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTROMAGNETIC FIELDS; WIRE;

CLOSE DISTANCE; CUT-WIRE ARRAYS; ENHANCED TRANSMISSION; EXPERIMENTAL EVIDENCE; EXPERIMENTAL IMPERFECTIONS; EXTRAORDINARY TRANSMISSION; FABRICATION TOLERANCES; METALLIC SCREEN; NUMERICAL PREDICTIONS; NUMERICAL STUDIES; SUB-WAVELENGTH; SUBWAVELENGTH SLITS; TRANSVERSE ELECTRIC FIELD; X/KU-BAND;

ELECTROMAGNETIC WAVE TRANSMISSION;

METAL;

ARTICLE; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ELECTROMAGNETIC FIELD; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; RADIATION SCATTERING; REFRACTOMETRY; THEORETICAL MODEL;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; ELECTROMAGNETIC FIELDS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; METALS; MODELS, THEORETICAL; REFRACTOMETRY; SCATTERING, RADIATION;

EID: 78650530222     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.026769     Document Type: Article

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