A reliability study of a new nanocrystalline nickel alloy barrier layer for electrical contacts

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

Volumn , Issue , 2010, Pages 73-81

  Do, Trent K ^a   Lund, Alan ^b  

^a Amphenol TCS and Xtalic Corporation   (United States)

^b Amphenol TCS and Xtalic Corporation   (United States)

Author keywords

Durability; Interdiffusion; Nanocrystalline; Nickel sulfamate; Wear track

Indexed keywords

ACHIEVABLE PERFORMANCE; BARRIER LAYERS; ELECTRICAL CONTACTS; HUMIDITY CYCLING; INDUSTRY STANDARDS; INTER-DIFFUSION; MECHANICAL VIBRATIONS; MIXED FLOWING GAS; NANO-CRYSTALLINE NICKEL; NANOCRYSTALLINES; QUALIFICATION TEST; SULFAMATES; TELCORDIA; TEST PROCEDURES; WEAR TRACKS;

CORROSION RESISTANCE; DURABILITY; ELECTRIC CONTACTS; ELECTRONICS INDUSTRY; INTERMETALLICS; NICKEL; NICKEL ALLOYS; RELIABILITY; STANDARDS; TESTING; VIBRATIONS (MECHANICAL); WEAR OF MATERIALS; WEAR RESISTANCE;

NANOCRYSTALLINE ALLOYS;

EID: 78650490964     PISSN: 03614395     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HOLM.2010.5619561     Document Type: Conference Paper

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