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Volumn 105, Issue 25, 2010, Pages

Far-infrared conductivity measurements of pair breaking in superconducting Nb0.5Ti0.5N thin films induced by an external magnetic field

(5) Xi, Xiaoxiang a Hwang, J a,b Martin, C a Tanner, D B a Carr, G L c

a University of Florida (United States)

b Pusan National University (South Korea)

c BROOKHAVEN NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED MAGNETIC FIELDS; EXTERNAL MAGNETIC FIELD; FAR-INFRARED; FILM SURFACES; PAIR BREAKING; REAL PART; REFLECTION MEASUREMENTS; SUPERCONDUCTING GAPS; SUPERCONDUCTING THIN FILM;

NIOBIUM COMPOUNDS; OPTICAL CONDUCTIVITY; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; THIN FILMS;

MAGNETIC FIELDS;

EID: 78650462990 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.105.257006 Document Type: Article

Times cited : (39)

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