Measurement of the coherence length of sputtered Nb0.62Ti0.38N thin films

IEEE Transactions on Applied Superconductivity

Volumn 12, Issue 2, 2002, Pages 1795-1798

  Yu, Lei ^a   Newman, Nathan ^a   Rowell, John M ^a,b  

^a AZ 85281   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

Coherence length; Low temperature superconductors; NbxTi1 xN; NbN; Proximity effect; Thin film

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRODES; NIOBIUM COMPOUNDS; SPUTTERING; SUPERCONDUCTING TRANSITION TEMPERATURE; THIN FILMS;

LOW TEMPERATURE SUPERCONDUCTORS;

SUPERCONDUCTING FILMS;

EID: 0036613178     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2002.1020339     Document Type: Article

References (15)

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