Sensitivity of polarimetric waveguide interferometer for different wavelengths

Acta Physica Polonica A

Volumn 118, Issue 6, 2010, Pages 1140-1142

  Gut, K ^a   Zakrzewski, A ^a   Pustelny, T ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ION EXCHANGE; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; SOFTWARE RELIABILITY; WAVEGUIDES;

DATA RELIABILITY; DIFFERENTIAL INTERFEROMETERS; ION-EXCHANGE METHODS; MEASUREMENT METHODOLOGY; SINGLE MODE WAVEGUIDES; WAVEGUIDE INTERFEROMETERS;

INTERFEROMETERS;

EID: 78650433198     PISSN: 05874246     EISSN: 1898794X     Source Type: Journal    
DOI: 10.12693/APhysPolA.118.1140     Document Type: Article

References (14)

1. T. Pustelny, Physical and Technical Aspects of OptoelectronicSensors, SUT University of Technology, Gliwice 2005.
2. T. Tamir, Integrated Optics, Springer-Verlag, NewYork 1979.
3. W. Lukosz, Sensors Actuators B 29, 37 (1995).
4. K. Gut, Acta Phys. Pol. A 114, 121 (2008).
5. K. Gut, J. Phys. IV 137, 91 (2006).
6. K. Gut, J. Phys. IV 129, 109 (2005).
7. K. Gut, K. Nowak, Eur. Phys. J.-Spec. Top. 154, 89(2008).
8. M. Błahut, D. Kasprzak, Acta Phys. Pol. A 116, 257(2009).
9. M. Błahut, D. Kasprzak, M. Sujewicz, Acta Phys.Pol. A 116, 264 (2009).
10. M. Błahut, K. Bazan, Acta Phys. Pol. A 116, 257(2009).
11. M. Błahut, D. Kasprzak, Opt. Appl. 33, 613 (2003).
12. R. Rogozinski, K. Gut, P. Karasinski, Z. Opilski, A. Opilski, Proc. SPIE 3581, 375 (1998).
13. K. Gut, A. Opilski Proc. SPIE 3744, 430 (1999).
14. K. Gut, P. Karasinski, A. Opilski, Z. Opilski, in:Proc. 11th Europ. Conf. on Solid-State Transducer, Ed. W. Sohler, University of Munster, Munster 1997, p. 1547.