The influence of a nanometric layer with a high refracting index on the sensitivity of the difference interferometer

Acta Physica Polonica A

Volumn 114, Issue 6 A, 2008, Pages

  Gut, K ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; ION EXCHANGE; PLANAR WAVEGUIDES;

COMPOSITE OPTICAL WAVEGUIDES; DIELECTRIC LAYER; DIFFERENCE INTERFEROMETERS; NANOMETRICS; OPTO-ELECTRONIC SENSORS; PROPERTIES OF COMPOSITES; SENSOR SYSTEMS;

OPTICAL WAVEGUIDES;

EID: 70349681211     PISSN: 05874246     EISSN: 1898794X     Source Type: Journal    
DOI: 10.12693/aphyspola.114.a-121     Document Type: Article

References (11)

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