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Volumn 26, Issue 6, 2010, Pages 999-1004

Detection of sprout-damaged wheat using thermal imaging

Author keywords

Artificial neural network; Sprout damage; Statistical classification; Thermal imaging; Wheat

Indexed keywords

ARTIFICIAL NEURAL NETWORK; SPROUT DAMAGE; STATISTICAL CLASSIFICATION; THERMAL IMAGING; WHEAT;

EID: 78650396553     PISSN: 08838542     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (21)

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