Adsorption site distributions on Cu(111), Cu(221), and Cu(643) as determined by Xe adsorption

Journal of Physical Chemistry C

Volumn 114, Issue 43, 2010, Pages 18566-18575

  Baker, Layton ^a   Holsclaw, Brian ^a   Baber, Ashleigh E ^b   Tierney, Heather L ^b   Sykes, E Charles H ^b   Gellman, Andrew J ^a,c  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b TUFTS UNIVERSITY   (United States)

^c NATIONAL ENERGY TECHNOLOGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION SITE; CU SURFACES; CU(1 1 1); DESORPTION KINETICS; DESORPTION TEMPERATURES; ENERGY DIFFERENCES; KINK SITES; SCANNING TUNNELING MICROSCOPY (STM); STEP EDGE;

ADSORPTION; BINDING ENERGY; EMISSION SPECTROSCOPY; LANDFORMS; NUCLEAR ENERGY; POTENTIAL ENERGY; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTAL SURFACES; SOIL CONSERVATION; TEMPERATURE PROGRAMMED DESORPTION; XENON;

BINDING SITES;

EID: 78650375304     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp106489f     Document Type: Article

References (51)

1. van Hove, M. A.; Somorjai, G. A. Surf. Sci. 1980, 92, 489-518.
2. McFadden, C. F.; Cremer, P. S.; Gellman, A. J. Langmuir 1996, 12, 2483-2487.
3. Sholl, D. S.; Asthagiri, A.; Power, T. D. J. Phys. Chem. B 2001, 105, 4771-4782.
4. Ahmadi, A.; Attard, G.; Feliu, J.; Rodes, A. Langmuir 1999, 15, 2420-2424.
5. Power, T. D.; Sholl, D. S. Top. Catal. 2002, 18, 201-208.
6. Hazen, R. M.; Sholl, D. S. Nat. Mater. 2003, 2, 367-374.
7. Sholl, D. S. Langmuir 1998, 14, 862-867.
8. Bhatia, B.; Sholl, D. S. Angew. Chem., Int. Ed. 2005, 44, 7761-7764.
9. Attard, G. A. J. Phys. Chem. B 2001, 105, 3158-3167.
10. Hazzazi, O. A.; Attard, G. A.; Wells, P. B. J. Mol. Catal. A: Chem. 2004, 216, 247-255.
11. Horvath, J. D.; Gellman, A. J. J. Am. Chem. Soc. 2001, 123, 7953-7954.
12. Horvath, J. D.; Gellman, A. J.; Sholl, D. S.; Power, T. D. In Enantiospecific Properties of Chiral Single Crystal Surfaces; Hicks, J. M., Ed.; American Chemical Society: Washington, DC, 2000; pp 269-282.
13. Horvath, J. D.; Gellman, A. J. J. Am. Chem. Soc. 2002, 124, 2384-2392.
14. Horvath, J. D.; Gellman, A. J. Top. Catal. 2003, 25, 9-15.
15. Horvath, J.; Kamakoti, P.; Koritnik, A.; Sholl, D. S.; Gellman, A. J. J. Am. Chem. Soc. 2004, 126, 14998-14994.
16. Horvath, J. D.; Baker, L.; Gellman, A. J. J. Phys. Chem. C 2008, 112, 7637-7643.
17. Greber, T.; Sljivancanin, Z.; Schillinger, R.; Wider, J.; Hammer, B. Phys. Rev. Lett. 2006, 96, 056103.
18. Sljivancanin, Z.; Gothelf, K. V.; Hammer, B. J. Am. Chem. Soc. 2002, 124, 14789-14794.
19. Rampulla, D. M.; Gellman, A. J. Surf. Sci. 2006, 600, 2823-2829.
20. Rampulla, D. M.; Francis, A. J.; Knight, K. S.; Gellman, A. J. J. Phys. Chem. B 2006, 110, 10411-10420.
21. Asthagiri, A.; Feibelman, P. J.; Sholl, D. S. Top. Catal. 2002, 18, 193-200.
22. Baber, A. E.; Gellman, A. J.; Sholl, D. S.; Sykes, E. C. H. J. Phys. Chem. C 2008, 112, 11086-11089.
23. Ertl, G.; Kuppers, J. Low Energy Electrons and Surface Chemistry, 2nd ed.; VCH Verlagsgesellschaft mbH: Weinheim, Germany, 1985.
24. Puisto, S. R.; Held, G.; King, D. A. Phys. Rev. Lett. 2005, 95, 036102.
25. Puisto, S. R.; Held, G.; Ranea, V.; Jenkins, S. J.; Mola, E. E.; King, A. A. J. Phys. Chem. B 2005, 109, 22456-22462.
26. Jones, G.; Gladys, M. J.; Ottal, J.; Jenkins, S. J.; Held, G. Phys Rev. B 2009, 79, 165420.
27. Giesen, M.; Dieluweit, S. J. Mol. Catal. A: Chem. 2004, 216, 263-272.
28. Clegg, M. L.; Driver, S. M.; Blanco-Rey, M.; King, D. A. J. Phys. Chem. C 2010, 114, 4114-4117.
29. Wandelt, K. J. Vac. Sci. Technol. A 1984, 2, 802-807.
30. Wandelt, K.; Markert, K.; Dolle, P.; Jablonski, A.; Niemantsverdriet, J. W. Surf. Interface Anal. 1988, 12, 15-20.
31. Jablonski, A.; Wandelt, K. Surf. Interface Anal. 1991, 17, 611-627.
32. Wandelt, K. Appl. Surf. Sci. 1997, 111, 1-10.
33. Bruch, L. W.; Diehl, R. D.; Venables, J. A. Rev. Mod. Phys. 2007, 79, 1381-1454.
34. Da Silva, J. L. F.; Barreteau, C.; Schroeder, K.; Blugel, S. Phys. Rev. B 2006, 73, 125402.
35. Da Silva, J. L. F.; Schroeder, K.; Bluegel, S. Phys. Rev. B 2004, 70, 245432.
36. Da Silva, J. L. F.; Schroeder, K.; Blugel, S. Phys. Rev. B 2004, 69, 245411.
37. Da Silva, J. L. F.; Schroeder, K.; Blugel, S. Phys. Rev. B 2005, 72, 033405.
38. Da Silva, J. L. F.; Stampfl, C.; Scheffler, M. Phys. Rev. B 2005, 72, 075424.
39. Park, J. Y.; Kahng, S. J.; Ham, U. D.; Kuk, Y.; Miyake, K.; Hata, K.; Shigekawa, H. Phys. Rev. B 1999, 60, 16934-16940.
40. Schroder, U.; Linke, R.; Boo, J. H.; Wandelt, K. Surf. Sci. 1996, 358, 873-878.
41. Weiss, P. S.; Eigler, D. M. Phys. Rev. Lett. 1992, 69, 2240-2243.
42. Eigler, D. M.; Weiss, P. S.; Schweizer, E. K.; Lang, N. D. Phys. Rev. Lett. 1991, 66, 1189-1192.
43. Eigler, D. M.; Schweizer, E. K. Nature 1990, 344, 524-526.
44. Bouju, X.; Joachim, C.; Girard, C.; Sautet, P. Phys. Rev. B 1993, 47, 7454-7461.
45. Stranick, S. J.; Kamna, M. M.; Weiss, P. S. Science 1994, 266, 99-102.
46. Chesters, M. A.; Hussain, M.; Pritchard, J. Surf. Sci. 1973, 35, 161-171.
47. Behm, R. J.; Brundle, C. R.; Wandelt, K. J. Chem. Phys. 1986, 85, 1061-73.
48. Schmidt, K. J.; Christmann, K. Surf. Sci. 2003, 525, 159-172.
49. Fusy, J.; Menaucourt, J.; Alnot, M.; Huguet, C.; Ehrhardt, J. J. Appl. Surf. Sci. 1996, 93, 211-220.
50. Wandelt, K. Atomic Scale Surface Characterization by Means of PAX (Photoemission of Adsorbed Xenon). In Chemistry and Physics of Solid Surfaces VIII; Springer Series in Surface Sciences; Vanselow, R., Howe, R. F., Eds.; 1990; Vol. 22, pp 289-334.
51. Zhao, X. Y.; Perry, S. S.; Horvath, J. D.; Gellman, A. J. Surf. Sci. 2004, 563, 217-224.