A model of the reflection distribution in the vacuum ultra violet region

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 619, Issue 1-3, 2010, Pages 59-62

  Silva, C ^a   Da Cunha, J Pinto ^a   Pereira, A ^a   Lopes, M I ^a   Chepel, V ^a   Solovov, V ^a   Neves, F ^a  

^a UNIVERSITY OF COIMBRA   (Portugal)

Author keywords

Diffuse; PTFE; Reflectance; Reflection; Rough surfaces; VUV; Xenon scintillation

Indexed keywords

FLUORINE CONTAINING POLYMERS; INTELLIGENT SYSTEMS; MONTE CARLO METHODS; POLYTETRAFLUOROETHYLENES; REFLECTION; SCINTILLATION;

ANGLE OF INCIDENCE; DIFFUSE; REFLECTION DISTRIBUTION; REFLECTION MODELS; ROUGH SURFACES; TOTAL REFLECTANCE; VACUUM ULTRAVIOLETS; XENON SCINTILLATION;

DISTRIBUTION FUNCTIONS;

EID: 78650256975     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.10.086     Document Type: Conference Paper

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