Charged micelle depletion attraction and interfacial colloidal phase behavior

Langmuir

Volumn 26, Issue 24, 2010, Pages 18710-18717

  Iracki, Tara D ^a   Beltran Villegas, Daniel J ^a   Eichmann, Shannon L ^a   Bevan, Michael A ^a  

^a Johns Hopkins University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED MICELLES; CRITICAL MICELLE CONCENTRATION (CMC); DEPLETION ATTRACTION; DEPLETION POTENTIAL; ELECTROSTATIC INTERACTIONS; EXCLUDED VOLUME; MICELLAR SYSTEMS; MONTE CARLO SIMULATIONS; OSMOTIC PRESSURE; SODIUM DODECYL SULFATE; SURFACE DEPLETION; TOTAL INTERNAL REFLECTION MICROSCOPY; VAN DER WAALS CONTRIBUTION; VIDEO MICROSCOPY;

COLLOID CHEMISTRY; CRITICAL MICELLE CONCENTRATION; ELECTROSTATICS; REFRACTIVE INDEX; SODIUM; SODIUM SULFATE; TWO DIMENSIONAL; VAN DER WAALS FORCES;

MICELLES;

EID: 78650213650     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la103701k     Document Type: Article

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