Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique

Optics Express

Volumn 18, Issue 25, 2010, Pages 26625-26630

  Ding, W ^a   Gorbach, A V ^a   Wadsworth, W J ^a   Knight, J C ^a   Skryabin, D V ^a   Strain, M J ^b   Sorel, M ^b   De La Rue, R M ^b  

^a University of Bath   (United Kingdom)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC PULSE; SOLITONS; WAVEGUIDES;

CHERENKOV; CRITICAL INPUTS; CROSS CORRELATION TECHNIQUES; CROSS CORRELATIONS; FEMTOSECOND PULSE; NON-LINEARITY; OPTICAL SOLITON; PEAK POWER; SILICON ON INSULATOR WAVEGUIDE; SILICON WAVEGUIDE; SOLITON FORMATION; SOLITON PULSE; SPECTRAL MEASUREMENT; SUB-WAVELENGTH; TIME AND FREQUENCY DOMAINS; TIME DOMAIN MEASUREMENT; WAVELENGTH RANGES;

TIME DOMAIN ANALYSIS;

SILICON;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LIGHT; RADIATION SCATTERING; REFRACTOMETRY; STATISTICAL ANALYSIS; STATISTICAL MODEL; STATISTICS;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; DATA INTERPRETATION, STATISTICAL; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LIGHT; MODELS, STATISTICAL; REFRACTOMETRY; SCATTERING, RADIATION; SILICON; STATISTICS AS TOPIC;

EID: 78650067612     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.026625     Document Type: Article

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