Position determination of scatter signatures - A novel sensor geometry

Talanta

Volumn 83, Issue 2, 2010, Pages 431-435

  Dicken, Anthony ^a   Rogers, Keith ^a   Evans, Paul ^b   Rogers, Joseph ^a   Chan, Jer Wang ^b   Wang, Xun ^b  

^a CRANFIELD UNIVERSITY   (United Kingdom)

^b NOTTINGHAM TRENT UNIVERSITY   (United Kingdom)

Author keywords

ADXRD; Angular dispersive; Drugs; Explosives; Security screening; X ray diffraction

Indexed keywords

CHARACTERIZATION; DIFFRACTION PATTERNS; EXPLOSIVES; GEOMETRY; INTERFEROMETRY; NETWORK SECURITY; X RAY DIFFRACTION;

ADXRD; ANGULAR DISPERSIVE; DETECTOR POSITIONS; DRUGS; MATERIALS CHARACTERISATION; POSITION DETERMINATION; PRIMARY X-RAY BEAMS; SECURITY SCREENING;

X RAY DETECTORS;

EID: 78649995086     PISSN: 00399140     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.talanta.2010.09.044     Document Type: Article

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