The separation of X-ray diffraction patterns for threat detection

Applied Radiation and Isotopes

Volumn 68, Issue 3, 2010, Pages 439-443

  Dicken, Anthony ^a   Rogers, Keith ^a   Evans, Paul ^b   Rogers, Joseph ^a   Chan, Jer Wang ^b  

^a CRANFIELD UNIVERSITY   (United Kingdom)

^b NOTTINGHAM TRENT UNIVERSITY   (United Kingdom)

Author keywords

ADXRD; Angular dispersive; Explosives; Threat detection; X ray diffraction

Indexed keywords

AVIATION SECURITY; CLUTTERED ENVIRONMENTS; DIFFRACTOGRAMS; MULTIPLE PERSPECTIVES; NOVEL METHODS; PRIMARY X-RAY BEAMS; THREAT DETECTION; X-RAY DIFFRACTOGRAMS;

DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EXPLOSIVES DETECTION;

ALUMINUM;

ANGULAR DISPERSIVE X RAY DIFFRACTION; ARTICLE; AVIATION SECURITY SCREENING; BRAGG LAW; DEVICE; GEOMETRY; MATERIALS; PRIORITY JOURNAL; RADIATION BEAM; SAMPLE; SCREENING; THEORY; THICKNESS; THREAT; VALIDATION PROCESS; X RAY DIFFRACTION; X RAY DIFFRACTOMETER;

EID: 74449093247     PISSN: 09698043     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apradiso.2009.11.072     Document Type: Article

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