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Volumn 105, Issue 24, 2010, Pages
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In situ observation of antisite defect formation during crystal growth
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Author keywords
[No Author keywords available]
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Indexed keywords
ANTI-SITE DEFECT;
IN-SITU;
IN-SITU OBSERVATIONS;
KINETIC TRAPPING;
LATTICE DEFECTS;
LATTICE DISTORTIONS;
LATTICE RESPONSE;
MD SIMULATION;
MOLECULAR DYNAMICS SIMULATIONS;
XRD;
CRYSTAL GROWTH;
CRYSTALLIZATION;
MOLECULAR DYNAMICS;
RIETVELD METHOD;
RIETVELD REFINEMENT;
X RAY DIFFRACTION;
DEFECTS;
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EID: 78649876652
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.105.245501 Document Type: Article |
Times cited : (13)
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References (14)
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