Orientation dependence of Pd growth on Au electrode surfaces

Journal of Physics Condensed Matter

Volumn 22, Issue 47, 2010, Pages

  Takahasi, M ^a   Tamura, K ^a   Mizuki, J ^a   Kondo, T ^b   Uosaki, K ^c  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b OCHANOMIZU UNIVERSITY   (Japan)

^c HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AU ELECTRODES; AU(1 1 1 ); CRITICAL THICKNESS; GROWING SURFACES; GROWTH MODES; LATERAL DIRECTIONS; LAYER DEPOSITION; MISFIT DISLOCATIONS; ORIENTATION DEPENDENCE; PD FILM; PSEUDOMORPHIC LAYERS; PSEUDOMORPHIC MONOLAYERS; STRUCTURAL INFORMATION; SURFACE NORMAL DIRECTIONS; SURFACE X-RAY SCATTERING;

CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); FILM GROWTH; MONOLAYERS; PALLADIUM;

GOLD;

GOLD; PALLADIUM;

ANISOTROPY; ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTRODE; EQUIPMENT; MATERIALS TESTING; METHODOLOGY; SURFACE PROPERTY; X RAY DIFFRACTION;

ANISOTROPY; CRYSTALLIZATION; ELECTRODES; EQUIPMENT FAILURE ANALYSIS; GOLD; MATERIALS TESTING; PALLADIUM; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 78649805041     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/22/47/474002     Document Type: Article

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