850 nm Germanium photodetector performance

IEEE International Conference on Group IV Photonics GFP

Volumn , Issue , 2006, Pages 170-172

  Morse, Mike ^a   Dosunmu, Femi ^a   Ginsburg, Eyal ^b   Chetrit, Yoel ^b   Sarid, Gadi ^b  

^a SBI Park Har Hotzvim ^*  (United States)

^b INTEL CORPORATION   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78649721958     PISSN: 19492081     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/group4.2006.1708202     Document Type: Conference Paper

References (3)

1. S. Luryi, A. Kastalsky, J.C. Bean, IEEE Transactions on Electron Devices, 31 (9), 1135 (1984).
2. J. Liu, J. Michel, W. Giziewicz, D. Pan, K. Wada, D. Cannon, S. Jongthammanurak, D. Danielson, L.C. Kimerling, J. Chen, F. O. Ilday, F. X. Kartner, J. Yasaitis, Applied Physics Letters, 87(10), 103501 (2005)
3. J.L. Polleux, C. Rumelhard, IEEE Symposium on EDMO, 167 (2000)