Composite THz materials using aligned metallic and semiconductor microwires, experiments and interpretation

Optics Express

Volumn 18, Issue 24, 2010, Pages 24632-24647

  Mazhorova, Anna ^a   Gu, Jian Feng ^a   Dupuis, Alexandre ^a   Peccianti, Marco ^b   Tsuneyuki, Ozaki ^b   Morandotti, Roberto ^b   Minamide, Hiroaki ^c   Tang, Ming ^c   Wang, Yuye ^c   Ito, Hiromasa ^c   Skorobogatiy, Maksim ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

^b INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE   (Canada)

^c RIKEN   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT; FABRICATION; LIGHT REFRACTION; METAL DRAWING; METAMATERIALS; PHASE SEPARATION; POLARIZATION; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTING SELENIUM COMPOUNDS; TIN; TRANSFER MATRIX METHOD; WIRE;

FABRICATION METHOD; FIBER FABRICATIONS; FTIR; HIGH REFRACTIVE INDEX; METALLIC ALLOYS; METALLIC WIRE; MICRO WIRE; MICROWIRE ARRAY; MULTI-STEP; PHASE SEPARATION EFFECTS; POLARIZATION INDEPENDENT; SUBMICROMETERS; TRANSFER-MATRIX THEORY;

COMPOSITE FILMS;

EID: 78649719514     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.024632     Document Type: Article

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