Investigation of Si atom migration in the framework of MSE-type zeolite YNU-2

Journal of Physical Chemistry C

Volumn 114, Issue 46, 2010, Pages 19641-19648

  Ikeda, Takuji ^a   Inagaki, Satoshi ^b   Hanaoka, Taka Aki ^a   Kubota, Yoshihiro ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b YOKOHAMA NATIONAL UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT SITES; FRAMEWORK STRUCTURES; MAGIC ANGLE SPINNING NMR; MICROPORES; POWDER X RAY DIFFRACTION; RELATIVE INTENSITY RATIO; RESONANCE PEAK; SI ATOMS; SILANOL GROUPS; SILICEOUS ZEOLITE; SITE OCCUPANCY; SOLID-STATE NMR SPECTROSCOPY; STEAM TREATMENT; STRUCTURE DIRECTING AGENTS; SUPERCAGES; THREE-DIMENSIONAL PORES; UNIT CELLS;

ATOMIC SPECTROSCOPY; CALCINATION; DEFECTS; LINEAR TRANSFORMATIONS; NUCLEAR MAGNETIC RESONANCE; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; RESONANCE; RIETVELD ANALYSIS; RIETVELD METHOD; SILICON; SILICON COMPOUNDS; STEAM; X RAY DIFFRACTION;

ATOMS;

EID: 78649716742     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp1079586     Document Type: Article

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