Structure analysis of si-atom pillared lamellar silicates having micropore structure by powder x-ray diffraction

Journal of Physical Chemistry C

Volumn 114, Issue 8, 2010, Pages 3466-3476

  Ikeda, Takuji ^a   Kayamori, Syunsuke ^a   Oumi, Yasunori ^b   Mizukami, Fujio ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

29SIMAS-NMR; ACID TREATMENTS; CRYSTALLINE STRUCTURE; FERRIERITE; HIGH THERMAL STABILITY; HYDROXYL GROUPS; LARGE PORES; LAYERED SILICATE; MICRO-PORE STRUCTURES; MICRO-POROUS STRUCTURE; MICROPORES; OPEN FRAMEWORKS; PORE OPENINGS; POWDER X RAY DIFFRACTION; RESONANCE PEAK; SI ATOMS; SILANOL GROUPS; SILANOLS; SILYLATIONS; STRUCTURE ANALYSIS; WATER MOLECULE;

ATOMS; COMPOSITE FILMS; DISSOLUTION; HYDROPHILICITY; LAMELLAR STRUCTURES; MICROPOROSITY; MICROPOROUS MATERIALS; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; SILICATES; SILICON; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTAL ATOMIC STRUCTURE;

EID: 77749261637     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp912026n     Document Type: Article

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