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Volumn 247, Issue 11-12, 2010, Pages 2797-2800

Evaluation of defect concentration in doped SWCNT

Author keywords

Defects; Raman spectroscopy; Spectroelectrochemistry; SWCNT

Indexed keywords


EID: 78649705536     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.201000180     Document Type: Article
Times cited : (4)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.