In situ determination of metastable zone width using dielectric constant measurement

Organic Process Research and Development

Volumn 14, Issue 6, 2010, Pages 1469-1472

  He, Guangwen ^a   Tjahjono, Martin ^a   Chow, Pui Shan ^a   Tan, Reginald B H ^a,b   Garland, Marc ^a  

^a INSTITUTE OF CHEMICAL AND ENGINEERING SCIENCES   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED DATA; CLOUD POINTS; CONVENIENT ALTERNATIVES; CRYSTALLIZATION PROCESS; DIELECTRIC CONSTANTS; FOCUSED BEAM REFLECTANCE MEASUREMENT; IN-SITU; IN-SITU MEASUREMENT; IN-SITU MONITORING; METASTABLE ZONE WIDTH; NEW OPPORTUNITIES; SOLUBILITY LIMITS; SOLUTION CRYSTALLIZATION; TURBIDITY MEASUREMENTS;

PROCESS MONITORING; TURBIDITY;

CRYSTALLIZATION;

EID: 78649678132     PISSN: 10836160     EISSN: 1520586X     Source Type: Journal    
DOI: 10.1021/op100182s     Document Type: Article

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