Phase composition and photoluminescence properties of radio-frequency sputtered pure and Sm3+-doped ZrO2 thin films

Journal of the American Ceramic Society

Volumn 93, Issue 10, 2010, Pages 3481-3485

  Nayak, Pramoda Kumar ^a   Kao, Wei Jung ^a   Sahu, Diptiranjan ^a,b   Huang, Jow Lay ^a   Huangw, Jow Lay ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b UNIVERSITY OF THE WITWATERSRAND   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; DOPED SAMPLE; DOPED ZIRCONIA; DOPING CONCENTRATION; EMISSION SPECTRUMS; LUMINESCENCE EFFICIENCIES; MONOCLINIC PHASE; PHASE COMPOSITION ANALYSIS; PHOTOLUMINESCENCE PROPERTIES; PL SPECTRA; RADIO FREQUENCIES; RADIO-FREQUENCY SPUTTERING; STRUCTURAL MODIFICATIONS; TETRAGONAL PHASE;

ANNEALING; CRYSTALLITE SIZE; EMISSION SPECTROSCOPY; PHASE COMPOSITION; PHOTOLUMINESCENCE; THIN FILMS; VAPOR DEPOSITION; ZIRCONIA; ZIRCONIUM ALLOYS;

DOPING (ADDITIVES);

EID: 78649613828     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2010.03881.x     Document Type: Article

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