Microlens characterization by digital holographic microscopy with physical spherical phase compensation

Applied Optics

Volumn 49, Issue 33, 2010, Pages 6448-6454

  Weijuan, Qu ^a   Choo, Chee Oi ^a   Yingjie, Yu ^b   Asundi, Anand ^c  

^a DEPARTMENT OF ELECTRONICS AND COMPUTER ENGINEERING   (Singapore)

^b SHANGHAI UNIVERSITY   (China)

^c NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ADAPTIVE OPTICS; MICROLENSES; MICROSCOPIC EXAMINATION; PHASE MEASUREMENT; SINGLE MODE FIBERS; WAVEFRONTS;

DIGITAL HOLOGRAPHIC MICROSCOPY; NUMERICAL COMPENSATION; NUMERICAL RECONSTRUCTION; PHASE COMPENSATION; REFERENCE BEAMS; REFERENCE FIBERS; REFERENCE WAVES; WAVEFRONT ABERRATIONS;

HOLOGRAPHY;

EID: 78649599867     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.006448     Document Type: Article

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