XRD, micro-XANES, EMPA, and SIMS investigation on phlogopite single crystals from Mt. Vulture (Italy)

American Mineralogist

Volumn 95, Issue 11-12, 2010, Pages 1657-1670

  Scordari, F ^a   Dyar, M D ^b   Schingaro, E ^a   Lacalamita, M ^a   Ottolini, L ^c  

^a UNIVERSITY OF BARI   (Italy)

^b MOUNT HOLYOKE COLLEGE   (United States)

^c CNR   (Italy)

Author keywords

Crystal chemistry; Micro XANES; SIMS; Substitution mechanisms; Volcanic phlogopite

Indexed keywords

ABSORPTION SPECTROSCOPY; BINARY ALLOYS; CHEMICAL ELEMENTS; CRYSTAL CHEMISTRY; ELECTRON PROBE MICROANALYSIS; IRON ALLOYS; LITHIUM COMPOUNDS; MICA; POTASSIUM ALLOYS; SECONDARY ION MASS SPECTROMETRY; SINGLE CRYSTALS; X RAY ABSORPTION; X RAY DIFFRACTION;

ANISOTROPIC DISPLACEMENT PARAMETERS; COEFFICIENT OF VARIATION; MICRO-X-RAY ABSORPTION NEAR-EDGE SPECTROSCOPIES; MICRO-XANES; SINGLE CRYSTAL X-RAY DIFFRACTION; STRUCTURE REFINEMENTS; SUBSTITUTION MECHANISMS; VOLCANIC PHLOGOPITE;

IRON METALLOGRAPHY;

ANISOTROPY; CHEMICAL ANALYSIS; CRYSTAL CHEMISTRY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; MASS SPECTROMETRY; PHLOGOPITE; SUBSTITUTION; X-RAY DIFFRACTION; XANES SPECTROSCOPY;

MICAS;

EID: 78649544360     PISSN: 0003004X     EISSN: 19453027     Source Type: Journal    
DOI: 10.2138/am.2010.3442     Document Type: Article

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