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Volumn 87, Issue 10, 2002, Pages 1477-1485

SIMS matrix effects in the analysis of light elements in silicate minerals: Comparison with SREF and EMPA data

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON PROBE MICROANALYSIS; ION BEAMS; IONS; IRON; MANGANESE COMPOUNDS; MASS SPECTROMETRY; MICA; SECONDARY EMISSION; SILICATES; SILICON; SINGLE CRYSTALS; UNCERTAINTY ANALYSIS;

EID: 0036811161     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-2002-1025     Document Type: Article
Times cited : (67)

References (36)
  • 2
    • 0001168837 scopus 로고
    • Quantitative analysis of silicates and oxide minerals: Comparison of Monte Carlo, ZAF, and Phi-Rho-Z procedures
    • (1988) Microbeam Analysis , vol.1988 , pp. 239-246
    • Armstrong, J.T.1
  • 25
    • 0034663103 scopus 로고    scopus 로고
    • Accurate quantification of H, Li, Be, B, F, Ba. REE. Y, Th and U in complex matrixes: A combined approach based on SIMS and single-crystal structure refinement
    • (2000) Analytical Chemistry , vol.72 , pp. 3731-3738
    • Ottolini, L.1    Oberti, R.2
  • 27
    • 0001573739 scopus 로고
    • Quantification of Lithium, Beryllium, and Boron in silicates by secondary ion mass spectrometry using conventional energy filtering
    • (1993) Analytical Chemistry , vol.65 , pp. 1960-1968
    • Ottolini, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.