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Volumn 87, Issue 10, 2002, Pages 1477-1485
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SIMS matrix effects in the analysis of light elements in silicate minerals: Comparison with SREF and EMPA data
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL STRUCTURE;
ELECTRON PROBE MICROANALYSIS;
ION BEAMS;
IONS;
IRON;
MANGANESE COMPOUNDS;
MASS SPECTROMETRY;
MICA;
SECONDARY EMISSION;
SILICATES;
SILICON;
SINGLE CRYSTALS;
UNCERTAINTY ANALYSIS;
ANALYSIS OF LIGHT ELEMENTS;
ANALYTICAL PROBLEMS;
ANALYTICAL UNCERTAINTY;
ANALYZED ELEMENTS;
CHEMICAL EFFECT;
CHEMICAL INFORMATION;
CRYSTALLOGRAPHIC ORIENTATIONS;
REFERENCE MATRIX;
MATRIX ALGEBRA;
CHEMICAL COMPOSITION;
CRYSTAL CHEMISTRY;
ELECTRON MICROSCOPY;
ION;
MASS SPECTROMETRY;
SILICATE MINERAL;
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EID: 0036811161
PISSN: 0003004X
EISSN: None
Source Type: Journal
DOI: 10.2138/am-2002-1025 Document Type: Article |
Times cited : (67)
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References (36)
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