Calibration issues for nanoindentation experiments: Direct atomic force microscopy measurements and indirect methods

Microscopy Research and Technique

Volumn 73, Issue 10, 2010, Pages 996-1004

  Barone, A C ^a   Salerno, M ^a   Patra, N ^a,b   Gastaldi, D ^c   Bertarelli, E ^c   Carnelli, D ^c   Vena, P ^c  

^a ISTITUTO ITALIANO DI TECNOLOGIA   (Italy)

^b UNIVERSITY OF GENOA   (Italy)

^c POLITECNICO DI MILANO   (Italy)

Author keywords

AFM; Diamond area function; Hardness; Machine compliance; Nanoindentation; Young modulus

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; FUSED SILICA; ITERATIVE METHODS; NANOINDENTATION;

AREA FUNCTION; ATOMIC-FORCE-MICROSCOPY; CALIBRATION PROCEDURE; DIAMOND AREA FUNCTION; INDIRECT CALIBRATION; MACHINE COMPLIANCE; NANO INDENTATION; NANOINDENTATION EXPERIMENTS; SHALLOW DEPTHS; YOUNG MODULUS;

HARDNESS;

EID: 78649476454     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20850     Document Type: Article

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