Effects of dissolved oxygen on electrochemical and semiconductor properties of 316L stainless steel

Journal of Nuclear Materials

Volumn 407, Issue 3, 2010, Pages 171-177

  Feng, Zhicao ^a   Cheng, Xuequn ^a   Dong, Chaofang ^a   Xu, Lin ^a   Li, Xiaogang ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

[No Author keywords available]

Indexed keywords

316 L STAINLESS STEEL; 316L SS; CATHODIC PROCESS; DIFFUSIVITIES; DONOR DENSITY; ELECTROCHEMICAL BEHAVIORS; FLAT BAND; KEY PARAMETERS; MOTT-SCHOTTKY ANALYSIS; PASSIVE FILMS; POINT DEFECT MODELS; POLARIZATION CURVES; SEMICONDUCTOR PROPERTIES; THREE SOLUTIONS;

DEFECTS; DISSOLUTION; ELECTROCHEMICAL PROPERTIES; POINT DEFECTS; STAINLESS STEEL;

DISSOLVED OXYGEN;

EID: 78649454751     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2010.10.010     Document Type: Article

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