Application of RPN analysis to parameter optimization of passive components

Microelectronics Reliability

Volumn 50, Issue 12, 2010, Pages 2012-2019

  Chen, K S ^a   Wang, C C ^b   Wang, C H ^b   Huang, C F ^a  

^a NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CELL PHONE; COMPETITIVE ADVANTAGE; ELECTRONIC PRODUCT; FREQUENCY CONTROL; FREQUENCY-SELECTIVE; HIGH FREQUENCY; HIGH PRECISION; LOW LOSS; MANUFACTURING PROCESS; NOTE-BOOK COMPUTER; OPTIMAL PARAMETER DESIGN; OSCILLATION CIRCUITS; OUTPUT FREQUENCY; PARAMETER OPTIMIZATION; PASSIVE COMPONENTS; PORTABLE CONSUMER ELECTRONICS; PROCESS QUALITY; QUALITY CHARACTERISTIC; QUALITY PROCESS; QUARTZ CRYSTAL; RISK PRIORITY NUMBER; TAGUCHI EXPERIMENTAL DESIGN; TEMPERATURE STABILITY; WIRELESS PHONES;

CAMERAS; COMMUNICATION; COMPETITION; CRYSTALLOGRAPHY; CUSTOMER SATISFACTION; FREQUENCY STANDARDS; INDUSTRIAL RESEARCH; LAPTOP COMPUTERS; OPTIMIZATION; QUARTZ; TELECOMMUNICATION EQUIPMENT; TELEPHONE SETS; WIRELESS LOCAL AREA NETWORKS (WLAN);

CRYSTAL OSCILLATORS;

EID: 78649448613     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2010.06.014     Document Type: Article

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