Asymptotic biometric analysis for large gallery sizes

IEEE Transactions on Information Forensics and Security

Volumn 5, Issue 4, 2010, Pages 955-964

  Baveja, Manas ^a   Yuan, Hongsong ^b   Wein, Lawrence M ^c  

^a Comac Capital LLP ^*  (United Kingdom)

^b Stanford University   (United States)

^c STANFORD UNIVERSITY   (United States)

Author keywords

Biometrics; extreme value theory; fingerprint recognition; probability

Indexed keywords

ASYMPTOTIC THEORIES; BIOMETRIC ANALYSIS; CORRECTION TERMS; EXTREME-VALUE THEORY; FINGERPRINT IMAGES; FINGERPRINT RECOGNITION; FINGERPRINT SYSTEMS; FIRST-ORDER; IDENTICALLY DISTRIBUTED RANDOM VARIABLES; IDENTIFICATION PROBABILITY; RECEIVER OPERATING CHARACTERISTIC CURVES; SET SYSTEM; SIMILARITY SCORES; TECHNOLOGY PROGRAMS;

ASYMPTOTIC ANALYSIS; BIOMETRICS; RANDOM VARIABLES;

PROBABILITY DISTRIBUTIONS;

EID: 78649415106     PISSN: 15566013     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIFS.2010.2058105     Document Type: Article

References (26)

1. First Phase of Visitor and Immigration Status Program Operating, but Improvements Needed U. S. General Accounting Office, Washington, DC, Report GAO-04-586, 2004.
2. Ballistic Imaging, D. L. Cork, J. E. Rolph, E. S. Meieran, and C. V. Petrie, Eds. Washington, DC: National Academies Press, 2008.
3. Iris Recognition Immigration System (IRIS) U. K. Border Agency, Mar. 29, 2010 [Online]. Available: http://www.ukba.homeoffice.gov. uk/managingborders/ technology/iris
4. Unique Identification Authority of India (UIADI) Jun. 16, 2010 [Online]. Available: http://uidai.gov. in
5. J. Galambos, The Asymptotic Theory of Extreme Order Statistics. Malabar, FL: Krieger, 1987.
6. E. J. Gumbel, Statistics of Extremes. New York: Columbia Univ. Press, 1958.
7. R. M. Bolle, J. H. Connell, S. Pankanti, N. K. Ratha, and A. W. Senior, Guide to Biometrics. New York: Springer-Verlag, 2004.
8. Report to the Congress: Use of Technology Standards and Interoperable Databases With Machine-Readable, Tamper-Resistant Travel Documents The Attorney General, Secretary of State, and the National Institute of Standards and Technology, Gaithersburg, MD, 2003.
9. C. L. Wilson, C. I. Watson, M. D. Garris, and A. Hicklin, "Studies of fingerprint matching using the NIST verification test bed (VTB)", in National Institute of Standards and Technology Internal Report 7020, Gaithersburg, MD, 2003.
10. P. P. Grother and P. J. Phillips, "Models of large population recognition performance", in Proc. 2004 IEEE Computer Society Conf. Computer Vision and Pattern Recognition (CVPR'04), 2004, pp. 68-77.
11. L. M. Wein and M. Baveja, "Using fingerprint image qualityto improve the identification performance of the U. S. Visitor and Immigrant Status Indicator Technology Program", PNAS, vol. 102, pp. 7772-7775, 2005.
12. M. R. Leadbetter, G. Lindgren, and H. Rootzen, Extremes and Related Properties of Random Sequences and Processes. Berlin: Springer-Verlag, 1983.
13. S. I. Resnick, Extreme Values, Regular Variation, and Point Processes. New York: Springer-Verlag, 1987.
14. C. S. Crow, IV, D. Goldberg, and W. Whitt, "Two-moment approximations for maxima", Operations Res., vol. 55, pp. 532-548, 2007.
15. N. L. Johnson, S. Kotz, and N. Balakrishnan, Continuous Univariate Distributions. New York: Wiley, 1995, vol. 1-2.
16. E. W. Weisstein, Extreme Value Distribution From MathWorld-A Wolfram Web Resource [Online]. Available: http://mathworld.wolfram.com/ ExtremeValueDistribution.html
17. M. Abramowitz and I. A. Stegun, Handbook of Mathematical Functions, With Formulas, Graphs, and Mathematical Tables. New York: Dover, 1964.
18. C. L. Wilson, M. D. Garris, and C. I. Watson, "Matching performance for the US-VISIT IDENT system using flat fingerprints", in National Institute of Standards and Technology Internal Report 7110, Gaithersburg, MD, 2004.
19. S. Kang and R. F. Serfozo, "Extreme values of phase-type and mixed random variables with parallel-processing examples", J. Appl. Prob., vol. 36, pp. 194-210, 1999.
20. M. Baveja, "An Analysis of the US-VISIT Biometric Program", Ph. D., Institute of Computational and Mathematical Engineering, Stanford University, Stanford, CA, 2007.
21. C. L. Wilson, R. A. Hicklin, H. Korves, B. Ulery, M. Zoepfl, M. Bone, P. Grother, R. Michaels, S. Otto, and C. Watson, "Fingerprint vendor technology evaluation 2003: Summary of results and analysis report", in National Institute of Standards and Technology Internal Report 7123, Gaithersburg, MD, 2004.
22. P. Embrechts, C. Kluppelberg, and T. Mikosch, Modelling Extremal Events. Berlin: Springer, 1997.
23. H. Jarosz and J.-C. Fondeur, "Large-scale identification system design", in Biometric Systems: Technology, Design and Performance Evaluation, J. Wayman, A. Jain, D. Maltoni, and D. Maio, Eds. London: Springer, 2005, ch. 9.
24. in National Institute of Standards and Technology. Biometric Quality Workshop II, 2008 [Online]. Available: http://www.itl.nist.gov/iad/894.03/ quality/workshop07/index.html
25. J. C. Wu and C. L. Wilson, "Nonparametric analysis of fingerprint data on large data sets", Pattern Recognit., vol. 40, pp. 2574-2584, 2007.
26. A. A. Balkema and L. de Haan, "Limit distributions for order statistics II", Theory of Probability and its Applications, vol. 23, pp. 341-358, 1978.