Defect detection and classification of machined surfaces under multiple illuminant directions

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7798, Issue , 2010, Pages

  Liao, Yi ^a   Weng, Xin ^a   Swonger, C W ^b   Ni, Jun ^a  

^a Department of Ecology and Evolutionary Biology   (United States)

^b Coherix Inc ^*  (United States)

Author keywords

classification; contrast enhancement; directional illumination; image processing; machine vision; segmentation

Indexed keywords

CLASSIFICATION; CONTRAST ENHANCEMENT; DIRECTIONAL ILLUMINATION; MACHINE VISION; SEGMENTATION;

AUTOMOTIVE INDUSTRY; COMPUTER VISION; ENGINE CYLINDERS; FEATURE EXTRACTION; IMAGE SEGMENTATION; IMAGING SYSTEMS; INSPECTION; THREE DIMENSIONAL; TWO DIMENSIONAL;

SURFACE DEFECTS;

EID: 78649414694     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.860867     Document Type: Conference Paper

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