Reflection-based surface segmentation using active illumination

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn , Issue , 2006, Pages 157-162

  Lindner, C ^a   Puente Leon F ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Illumination space sampling; Reflection properties; Segmentation; Surface quality measurement

Indexed keywords

DATA ACQUISITION; FEATURE EXTRACTION; LIGHT REFLECTION; MATHEMATICAL MODELS; PARAMETER ESTIMATION; SURFACE PROPERTIES;

ILLUMINATION SPACE SAMPLING; SPATIAL RESOLUTION; SURFACE QUALITY MEASUREMENT;

IMAGE SEGMENTATION;

EID: 34547871027     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2006.235956     Document Type: Conference Paper

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