Reliability improvement in III-V concentrator solar cells by means of perimeter protection

AIP Conference Proceedings

Volumn 1277, Issue , 2010, Pages 221-224

  Gonzalez, José R ^a   Vázquez, Manuel ^a   Núñez, Neftalí ^a   Algora, Carlos ^a   Espinet, Pilar ^a  

^a UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

Author keywords

Degradation; Qualification; Reliability

Indexed keywords

EID: 78649254590     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3509196     Document Type: Conference Paper

References (20)

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