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Volumn 1277, Issue , 2010, Pages 225-228

Quantifying the thermal fatigue of CPV modules

Author keywords

Accelerated lifetime testing; Die attach; Rainflow; Thermal fatigue

Indexed keywords


EID: 78649231220     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3509197     Document Type: Conference Paper
Times cited : (12)

References (4)
  • 2
    • 84954546936 scopus 로고    scopus 로고
    • Standard practices for cycle counting in fatigue analysis
    • West Conshohocken, PA
    • "Standard practices for cycle counting in fatigue analysis," ASTM International Standard E 1049-85, West Conshohocken, PA 2005.
    • (2005) ASTM International Standard e 1049-85
  • 3
    • 0142227054 scopus 로고    scopus 로고
    • A life consumption monitoring methodology for electronic systems
    • IEEE Transactions on
    • A. Ramakrishnan and M. G. Pecht, "A life consumption monitoring methodology for electronic systems," Components and Packaging Technologies, IEEE Transactions on, vol. 26, pp. 625-634, 2003
    • (2003) Components and Packaging Technologies , vol.26 , pp. 625-634
    • Ramakrishnan, A.1    Pecht, M.G.2
  • 4
    • 0027540946 scopus 로고
    • Generic reliability figures of merit design tools for surface mount solder attachments
    • IEEE Transactions on
    • W. Engelmaier, "Generic reliability figures of merit design tools for surface mount solder attachments," Components, Hybrids, and Manufacturing Technology, IEEE Transactions on, vol. 16, pp. 103-112,1993
    • (1993) Components, Hybrids, and Manufacturing Technology , vol.16 , pp. 103-112
    • Engelmaier, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.