Study on the microstructure and dielectric properties of X9R ceramics based on BaTiO3

Materials Science and Engineering: B

Volumn 176, Issue 1, 2011, Pages 68-71

  Gao, Shunqi ^a   Wu, Shunhua ^a   Zhang, Yonggang ^a   Yang, Hongxing ^a   Wang, Xinru ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Dielectric properties; Microstructure; X9R

Indexed keywords

BARIUM TITANATE; CERAMIC MATERIALS; CURIE TEMPERATURE; DIELECTRIC LOSSES; TIN COMPOUNDS;

CURIE POINTS; CURIE WEISS LAW; DIELECTRICS PROPERTY; HIGH CURIE TEMPERATURE; HIGHEST TEMPERATURE; MICROSTRUCTURES PROPERTIES; TEMPERATURE COEFFICIENT OF CAPACITANCE; X9R;

MICROSTRUCTURE;

EID: 78449246159     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2010.09.004     Document Type: Article

References (8)

1. Y. Yuan J. Mater. Sci. Mater. Electron. 20 2009 157
2. N. Baskaran, and H. Chang J. Mater. Sci.: Mater. Electron. 12 2001 527
3. Y. Yuan, S. Zhang, and C. Li J. Mater. Sci. Mater. Electron. 15 2004 601
4. L. Wen Mater. Lett. 57 2002 1
5. H. Chazono J. Am. Ceram. Soc. 83 2000 101
6. S. Shirasaki Bull. Chem. Soc. Japan 47 2009 568
7. B.P. Das Ceram. Trans. 103 2004 261
8. B. Li Inorg. Dielectric Mater. 1986 50