Effect of Nd doping on structural, dielectric and electrical properties of Pb(SnTi)O3 ferroelectric ceramics

British Ceramic Transactions

Volumn 103, Issue 6, 2004, Pages 261-267

  Das, B P ^a   Choudhary, R N P ^b   Mahapatra, P K ^a  

^a VIDYASAGAR UNIVERSITY   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

AC conductivity; Dielectric behaviour; Ferroelectric ceramics; Loss tangent; Nd doping; Polarisation; Transition temperature

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL STRUCTURE; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; GRAIN SIZE AND SHAPE; HIGH TEMPERATURE EFFECTS; LEAD COMPOUNDS; NEODYMIUM; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS;

AC CONDUCTIVITY; DIELECTRIC BEHAVIOUR; GRAIN SIZE DISTRIBUTION; NEODYMIUM DOPING;

FERROELECTRIC CERAMICS;

EID: 11044226596     PISSN: 09679782     EISSN: None     Source Type: Journal    
DOI: 10.1179/096797804X4565     Document Type: Article

References (22)

1. G. SHIRANE, S. HOSHINO and K. SUZUKi: Phys. Rev., 1950, 80, 1105-1106.
2. B. JAFFE, R. S. ROTH and S. MARZULLO: J. Appl. Phys., 1954, 25 809-810.
3. J. M. HERBERT: 'Ferroelectric transducers and sensors'; 1982, London, Gordon & Breach.
4. C. E. LAND and P. D. THATCHER: Proc. IEEE, 1969, 57, 751.
5. W. D. SMITH and C. E. LAND: Appl. Phys. Lett., 1972, 20, 169.
6. B. JAFFE, W. R. COOK and H. JAFFE: 'Piezoelectric ceramics'; 1971, London, Academic Press.
7. F. CALDERON, J. M. SIQUEIROS, J. PORTELLOS and J. L. HEIRAS: Solid State Commun., 1999, 112, 219-221.
8. S. NOMURA: J. Phys. Soc. Jpn., 1955, 10, 112.
9. G. A. SMOLENSKJI, A. I. AGRANOVSKAYA and A. M. KALINIMA: Zh. Tekh. Fiz., 1955, 25, 2134.
10. S. KAMBA, V. BOVTUN, J. PETZELT, I. RYCHETSKY, R. MIZARAS, A. BRILINGAS, J. BANYS, J. GRIGAS and M. KOSEC: J. Phys., Condens. Matter, 2000, 12, 497-519.
11. S. R. SHANNIGRAHI, R. N. P. CHOUDHARY, H. N. ACHARYA and T. P. SINHA: J. Appl. Phys., 1999, 85, 1539-1547.
12. N. SETTER and L. E. CROSS: J. Mater. Sci., 1980, 15, 2478-4482.
13. H. P. KLUNG and L. B. ALEXANDER: 'X-ray diffraction procedures', 687; 1974, New York, NY, Wiley.
14. Y. GOTO: J. Phys. Soc. Jpn., 1981, 50, 538-542.
15. R. C. BUCHANAN: 'Ceramic materials for electronics', 45; 1986, New York, NY, Dekker.
16. W. SHOCKLEY and W. T. READ: Phys. Rev., 1952, 87, 835-842.
17. M. MONNERAYE, J. SERINDAT and C. JOUWERSMA: Glass Technol., 1968, 9, 70-77.
18. T. KIMURA, M. MACHIDA, T. YAMAGUCHI and R. E. NEWNHAM: J. Am. Ceram. Soc., 1983, 66, C195-C197.
19. O. PEREZ MARTINEZ, F. CALDERON PINAR and A. PELAIZ BARRANCO: Solid State Commun., 2001, 117, 489-493.
20. A. K. JONSCHER: Nature, 1977, 267, 673.
21. C. ANG, Z. YU and L. E. CROSS: Phys. Rev., 2000, B62, 228-236.
22. C. ANG, Z. YU, Z. JING, P. LUNKENHEIMER and A. LOIDL: Phys. Rev. B. 2000, 61, 3922-3926.