Microwave dielectric properties of La(1-2x/3)Ba x(Mg0.5Sn0.5)O3 ceramics

Crystal Research and Technology

Volumn 45, Issue 11, 2010, Pages 1149-1153

  Chen, Yih Chien ^a   Chen, Kuei Chien ^a   Hsu, Wei Yu ^a  

^a LUNGHWA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

dielectric constant; La(1 2x 3)Bax(Mg0.5Sn0.5)O 3; quality factor; temperature coefficient of resonant frequency; X ray diffraction pattern

Indexed keywords

DIELECTRIC CONSTANTS; LA(1-2X/3)BAX(MG0.5SN0.5)O 3; MICROWAVE DIELECTRIC PROPERTIES; POTENTIAL APPLICATIONS; QUALITY FACTORS; RECTENNAS; TEMPERATURE COEFFICIENT OF RESONANT FREQUENCY;

BARIUM; CERAMIC MATERIALS; DIFFRACTION PATTERNS; INTERFEROMETRY; PERMITTIVITY; TIN; X RAY DIFFRACTION;

NATURAL FREQUENCIES;

EID: 78249261197     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.201000463     Document Type: Article

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