Microwave dielectric properties of (1-x)La(Mg0.5Sn 0.5)O3-x(Sr0.8Ca0.2) 3Ti2O7 ceramic system with a near zero temperature coefficient of resonant frequency

Crystal Research and Technology

Volumn 45, Issue 8, 2010, Pages 830-834

  Chen, Yih Chien ^a   Wang, Yen Nien ^a   Chen, Kai Hao ^a  

^a LUNGHWA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Ceramic; Dielectric constant; Quality factor; Temperature coefficient of resonant frequency; X ray diffraction

Indexed keywords

AVERAGE GRAIN SIZE; AVERAGE VALUES; CERAMIC; CERAMIC SYSTEMS; DIELECTRIC CONSTANTS; DIFFRACTION PEAKS; MICROWAVE DIELECTRIC PROPERTIES; MOBILE COMMUNICATIONS; NEAR-ZERO TEMPERATURE; PHASE DIFFERENCE; QUALITY FACTORS; SINTERING TEMPERATURES; SOLID STATE METHOD; TEMPERATURE COEFFICIENT OF RESONANT FREQUENCY;

CALCIUM; CERAMIC MATERIALS; DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY; PERMITTIVITY; SINTERING; TIN; X RAY DIFFRACTION; X RAYS;

NATURAL FREQUENCIES;

EID: 77955758488     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.201000073     Document Type: Article

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