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Solid State Communications

Volumn 150, Issue 47-48, 2010, Pages 2346-2349

Influence of annealing conditions on the structure and compositions of electrodeposited CuInSe2 films

(6) Zhang, Zhongwei a Li, Ji a Wang, Man a Wei, Ming a Jiang, Guoshun a Zhu, Changfei a

a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

Author keywords

A. CuInSe2 film; B. Electrodeposition, annealing; E. Raman spectroscopy

Indexed keywords

A. CUINSE2 FILM; ANNEALED SAMPLES; ANNEALING CONDITION; ANNEALING PROFILES; ANNEALING TEMPERATURES; B. ELECTRODEPOSITION, ANNEALING; CRYSTALLINE QUALITY; CRYSTALLINITIES; E. RAMAN SPECTROSCOPY; GRAIN SIZE; HIGH-EFFICIENCY SOLAR CELLS; LOW COSTS; SCATTERING ANALYSIS; SELENIUM VAPOR;

COPPER COMPOUNDS; CRYSTALLINE MATERIALS; ELECTRODEPOSITION; LEAD COMPOUNDS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SELENIUM; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

ANNEALING;

EID: 78249257593 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/j.ssc.2010.09.048 Document Type: Article

Times cited : (12)

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