Wavelength dependence of photoelectron spectra in above-threshold ionization

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 43, Issue 18, 2010, Pages

  Marchenko, T ^a,b,c   Muller, H G ^a   Schafer, K J ^d   Vrakking, M J J ^a,e  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b Université Pierre et Marie Curie   (France)

^c LABORATOIRE D OPTIQUE APPLIQUÉE   (France)

^d LOUISIANA STATE UNIVERSITY   (United States)

^e MAX BORN INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABOVE-THRESHOLD IONIZATION; COHERENT ADDITION; DINGER EQUATION; ELECTRON ENERGY SPECTRUM; EXPERIMENTAL DATA; FEMTO-SECOND LASER; FOCAL VOLUME; INTENSITY DEPENDENCE; LASER INTENSITIES; LASER WAVELENGTH; NONRESONANT; NUMERICAL SOLUTION; PHOTOELECTRON SPECTRUM; RESONANCE-ENHANCED IONIZATIONS; STRONG FIELD IONIZATION; SUB-STRUCTURES; SWITCHING EFFECT; SYSTEMATIC ANALYSIS; TIME-DEPENDENT; WAVELENGTH DEPENDENCE; WAVELENGTH RANGES;

ARGON LASERS; PARTICLE DETECTORS; PHOTOELECTRON SPECTROSCOPY; PHOTONS; PULSED LASER APPLICATIONS; RESONANCE; SPECTROSCOPY; XENON;

PHOTOIONIZATION;

EID: 78249250553     PISSN: 09534075     EISSN: 13616455     Source Type: Journal    
DOI: 10.1088/0953-4075/43/18/185001     Document Type: Article

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