Resolving ensembled microstructural information of bulk-metallic-glass- matrix composites using synchrotron x-ray diffraction

Applied Physics Letters

Volumn 97, Issue 17, 2010, Pages

  Qiao, J W ^a,b   Huang, E W ^c   Jiang, F ^b   Ungar T ^d   Csiszar G ^d   Li, L ^b   Ren, Y ^e   Liaw, P K ^b   Zhang, Y ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

^b University of Tennessee   (United States)

^c NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^d EÖTVÖS LORÁND UNIVERSITY   (Hungary)

^e ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATRICES; AZIMUTHAL DIRECTION; CRYSTALLINE PHASE; DIFFRACTION INTENSITY; HIGH-ENERGY SYNCHROTRON X-RAYS; INTENSITY DISTRIBUTION; METALLIC GLASS MATRIX COMPOSITE; MICRO MECHANISMS; MICRO-STRAIN; MICRO-STRUCTURAL CHARACTERIZATION; MICROSTRUCTURAL INFORMATION; PEAK WIDTHS; SPATIAL ARRANGEMENTS; SYNCHROTRON X RAY DIFFRACTION; TWO-DIMENSIONAL DETECTORS; WILLIAMSON-HALL PLOT;

CRYSTALLINE MATERIALS; DIFFRACTION; GLASS; METALLIC MATRIX COMPOSITES; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY DIFFRACTION;

X RAY DIFFRACTION ANALYSIS;

EID: 78149458891     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3506694     Document Type: Article

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