Microwave imaging reflectometry studies for turbulence diagnostics on KSTAR

Review of Scientific Instruments

Volumn 81, Issue 10, 2010, Pages

  Park, H K ^a   Hong, I ^a   Kim, M ^a   Yun, G S ^a   Lee, W ^a   Kim, J ^a   Tobias, B ^b   Domier, C W ^b   Luhmann Jr , N C ^b   Kim, K W ^c  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Kyungpook National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

LABORATORY TEST; LARGE AMPLITUDE; MICROWAVE IMAGING REFLECTOMETRY; MULTI FREQUENCY; PERFORMANCE DEGRADATION; PLASMA OPERATIONS; PROBE BEAM; REFLECTOMETRY; SYSTEM DESIGN; WAVE NUMBERS;

IMAGING SYSTEMS; REFLECTOMETERS;

REFLECTION;

EID: 78149442169     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3499606     Document Type: Conference Paper

References (6)

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