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Volumn 45, Issue 4, 2003, Pages 469-487

Laboratory characterization of an imaging reflectometer system

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC FIELDS; IMAGING TECHNIQUES; MICROWAVES; PLASMA DENSITY; PLASMA TURBULENCE; POLARIZATION; TOKAMAK DEVICES;

EID: 0037395198     PISSN: 07413335     EISSN: None     Source Type: Journal    
DOI: 10.1088/0741-3335/45/4/311     Document Type: Article
Times cited : (36)

References (20)
  • 14
    • 0013108282 scopus 로고    scopus 로고
    • Mönchmattweg 5 CH-5035 Unterentfelden, Switzerland
    • Leica Geosystems A G, Mönchmattweg 5 CH-5035 Unterentfelden, Switzerland www.leica-geosystems.com
  • 20
    • 0013059515 scopus 로고    scopus 로고
    • PhD Thesis UCLA
    • Gilmore M A 1999 PhD Thesis UCLA
    • (1999)
    • Gilmore, M.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.