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Volumn 45, Issue 4, 2003, Pages 469-487
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Laboratory characterization of an imaging reflectometer system
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
ELECTRIC FIELDS;
IMAGING TECHNIQUES;
MICROWAVES;
PLASMA DENSITY;
PLASMA TURBULENCE;
POLARIZATION;
TOKAMAK DEVICES;
PLASMA REFLECTION;
REFLECTOMETERS;
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EID: 0037395198
PISSN: 07413335
EISSN: None
Source Type: Journal
DOI: 10.1088/0741-3335/45/4/311 Document Type: Article |
Times cited : (36)
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References (20)
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